<?xml version="1.0" encoding="UTF-8"?>
<collection xmlns="http://www.loc.gov/MARC21/slim">
 <record>
  <leader>01851nam a2200217Ia 4500</leader>
  <controlfield tag="001">CTU_133197</controlfield>
  <controlfield tag="008">210402s9999    xx            000 0 und d</controlfield>
  <datafield tag="020" ind1=" " ind2=" ">
   <subfield code="c">4779000</subfield>
  </datafield>
  <datafield tag="082" ind1=" " ind2=" ">
   <subfield code="a">620.44</subfield>
  </datafield>
  <datafield tag="082" ind1=" " ind2=" ">
   <subfield code="b">D489</subfield>
  </datafield>
  <datafield tag="245" ind1=" " ind2="0">
   <subfield code="a">Developments in surface contamination and cleaning :</subfield>
  </datafield>
  <datafield tag="245" ind1=" " ind2="0">
   <subfield code="b">fundamentals and...</subfield>
  </datafield>
  <datafield tag="245" ind1=" " ind2="0">
   <subfield code="c">edited by Rajiv Kohli and K.L. Mittal.</subfield>
  </datafield>
  <datafield tag="260" ind1=" " ind2=" ">
   <subfield code="a">Norwich, NY, U.S.A.</subfield>
  </datafield>
  <datafield tag="260" ind1=" " ind2=" ">
   <subfield code="b">W. Andrew Pub</subfield>
  </datafield>
  <datafield tag="260" ind1=" " ind2=" ">
   <subfield code="c">2008</subfield>
  </datafield>
  <datafield tag="520" ind1=" " ind2=" ">
   <subfield code="a">Surface contamination is of cardinal importance in a host of technologies and industries, ranging from microelectronics to optics to automotive to biomedical. Thus, the need to understand the causes of surface contamination and their removal is very patent. Generally speaking, there are two broad categories of surface contaminants: film-type and particulates. In the world of shrinking dimensions, such as the ever-decreasing size of microelectronic devices, there is an intensified need to understand the behavior of nanoscale particles and to devise ways to remove them to an acceptable level. Particles which were functionally innocuous a few years ago are killer defects today, with serious implications for yield and reliability of the components. This amply referenced and illustrated book addresses the sources, detection, characterization and removal of both kinds of contaminants, as well as ways to prevent surfaces from being contaminated. A number of techniques to monitor the level of cleanliness are also discussed and a special emphasis is placed on the behavior of nanoscale particles throughout the book.</subfield>
  </datafield>
  <datafield tag="650" ind1=" " ind2=" ">
   <subfield code="a">Surfaces (Technology),Surface contamination,Particles,Cleaning,Coatings,Dust control.</subfield>
  </datafield>
  <datafield tag="650" ind1=" " ind2=" ">
   <subfield code="x">Inspection.,Prevention,Measurement,Môi trường mặt biển</subfield>
  </datafield>
  <datafield tag="904" ind1=" " ind2=" ">
   <subfield code="i">Năm</subfield>
  </datafield>
  <datafield tag="980" ind1=" " ind2=" ">
   <subfield code="a">Trung tâm Học liệu Trường Đại học Cần Thơ</subfield>
  </datafield>
 </record>
</collection>
