01449nam a2200217Ia 4500 CTU_138060 210402s9999 xx 000 0 und d 150.00 621.3815 M626 Miczo, Alexander Digital logic testing and simulation Alexander Miczo Hoboken, NJ John Wiley & Sons 2003 The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: - Binary Decision Diagrams (BDDs) and cycle-based simulation - Tester architectures/Standard Test Interface Language (STIL) - Practical algorithms written in a Hardware Design Language (HDL) - Fault tolerance - Behavioral Automatic Test Pattern Generation (ATPG) -The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability. Digital electronics,Điện tử số Testing,Sự nghiên cứu Đặng Cẩm Thuỳ Trung tâm Học liệu Trường Đại học Cần Thơ