01537nam a2200217Ia 4500 CTU_156179 210402s9999 xx 000 0 und d 92 537.6 E64 Epioptics - 7 : proceedings of the 24th course of the International School of Solid State Physics: Erice, Italy, 20-26 July 2002 Editor, Antonio Cricenti. River Edge, N.J. World Scientific 2004 This book assesses the capabilities of state-of-the-art optical techniques in elucidating the fundamental electronic and structural properties of semiconductor and metal surfaces, interfaces, thin layers, and layer structures. It also examines the usefulness of these techniques for optimization of high quality multilayer samples through feedback control during materials growth and processing. Emphasis is given to dynamical processes through the use of pump–probe techniques, together with the search for new optical sources. Some new applications of scanning probe microscopy to materials science and biological samples (dried and in vivo) with the use of different laser sources are also presented. Semiconductors,Surfaces (Physics),Spectrum analysis,Chất bán dẫn,Bề mặt ( vật lý ),Phân tích quang phổ Surfaces,Optical properties,Optical properties,Bề mặt,Đặc tính quang học QHieu Trung tâm Học liệu Trường Đại học Cần Thơ