01855nam a2200217Ia 4500 CTU_157777 210402s9999 xx 000 0 und d 46.83 621.395 V865 VLSI test principles and architectures : Design for testability Edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen Amsterdam Elsevier Morgan Kaufmann Publishers 2006 This book is a fundamental VLSI Testing and Design-for-Testability (DFT) textbook allowing undergraduates, DFT practitioners, and VLSI designers to learn quickly the basic VLSI Test concepts, principles, and architectures, for test and diagnosis of digital, memory, and analog/mixed-signal designs. VLSI Testing is very basic to the semiconductor industry and is something that almost everyone in the industry needs to have some knowledge of. It is often not sufficiently covered in undergraduate curricula; therefore this book fill the gap in this area for both students and professionals in semiconductor manufacturing, design, systems, electronic design automation (EDA), etc. As 100 million transistor designs are now common, test costs are 25-40% of the overall cost of manufacturing a chip and how a chip is designed greatly impacts the cost of test. As such, it is important for designers and managers to understand the concepts and principles of testing and design-for-test techniques. Integrated circuits,Integrated circuits,Mạch tích hợp,Mạch tích hợp Very large scale integration,Testing,Very large scale integration,Design,Mạch tích hợp quy mô lớn,Kiểm tra,Mạch tích hợp quy mô lớn,Thiết kế Trọng Hải Trung tâm Học liệu Trường Đại học Cần Thơ