01094nam a2200217Ia 4500 CTU_168355 210402s9999 xx 000 0 und d 44.89 620.192 B854 Briggs, D Surface analysis of polymers by XPS and static SIMS D. Briggs Cambridge Cambridge University Press 1998 This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. Polymers,X-ray spectroscopy,Secondary ion mass Spectrometry,Polyme,Tia X,Khối lượng ion Surfaces,Analysis,Bề mặt,Phân tích Lan Trung tâm Học liệu Trường Đại học Cần Thơ