01012nam a2200217Ia 4500 CTU_210740 210402s9999 xx 000 0 und d 2.30 537.622 F432 Fewster, Paul F. X-ray scattering from semiconductors Paul F. Fewster London Imperial College Press 2000 This text provides a description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which is common to materials other than semiconductors. Semiconductors,X-quang,Chất bán dẫn,X-rays Tán xạ,Scattering Qhieu Trung tâm Học liệu Trường Đại học Cần Thơ