Electron beam ion sources and traps and their applications : 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000 - International Symposium on Electron Beam Ion Sources and Traps and their Applications 2000 : Upton, N.Y.); Prelec, Krsto (Melville, N.Y. : American Institute of Physics, 2001)
Includes bibliographical references and index.
Keywords: Electron beams -- Congresses; Ion sources -- Congresses