Lee, J., & Lee, H. Analysis and calibration of transient enhanced diffusion for indium impurity in nanoscale semiconductor devices.
Trích dẫn kiểu ChicagoLee, Jun-Ha., và Hoong-Joo Lee. Analysis and Calibration of Transient Enhanced Diffusion for Indium Impurity in Nanoscale Semiconductor Devices.
MLA CitationLee, Jun-Ha., và Hoong-Joo Lee. Analysis and Calibration of Transient Enhanced Diffusion for Indium Impurity in Nanoscale Semiconductor Devices.
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