APA Citation

Lee, J., & Lee, H. Analysis and calibration of transient enhanced diffusion for indium impurity in nanoscale semiconductor devices.

Chicago Style Citation

Lee, Jun-Ha., and Hoong-Joo Lee. Analysis and Calibration of Transient Enhanced Diffusion for Indium Impurity in Nanoscale Semiconductor Devices.

MLA Citation

Lee, Jun-Ha., and Hoong-Joo Lee. Analysis and Calibration of Transient Enhanced Diffusion for Indium Impurity in Nanoscale Semiconductor Devices.

Warning: These citations may not always be 100% accurate.