Citazione APA

Lee, J., & Lee, H. Analysis and calibration of transient enhanced diffusion for indium impurity in nanoscale semiconductor devices.

Stile di citazione Chicago

Lee, Jun-Ha., e Hoong-Joo Lee. Analysis and Calibration of Transient Enhanced Diffusion for Indium Impurity in Nanoscale Semiconductor Devices.

Citazione MLA

Lee, Jun-Ha., e Hoong-Joo Lee. Analysis and Calibration of Transient Enhanced Diffusion for Indium Impurity in Nanoscale Semiconductor Devices.

Attenzione: Queste citazioni potrebbero non essere precise al 100%.