http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Photoreflectance measurement in Si3N4/Al0.21Ga0.79As/GaAs heterostructure
Jae-In Yu, Hun-Bo Park, Sang-Su Choi, Ki-Hong Kim, In-Ho Bae.