Cita APA

Kim, Y., & Park, S. Analysis of the influence of the address electrode width on high-speed addressing using the VT close curve and dynamic vdata margin.

Citación estilo Chicago

Kim, Yongduk., y Sekwang Park. Analysis of the Influence of the Address Electrode Width On High-speed Addressing Using the VT Close Curve and Dynamic Vdata Margin.

Cita MLA

Kim, Yongduk., y Sekwang Park. Analysis of the Influence of the Address Electrode Width On High-speed Addressing Using the VT Close Curve and Dynamic Vdata Margin.