Citazione APA

Kim, Y., & Park, S. Analysis of the influence of the address electrode width on high-speed addressing using the VT close curve and dynamic vdata margin.

Stile di citazione Chicago

Kim, Yongduk., e Sekwang Park. Analysis of the Influence of the Address Electrode Width On High-speed Addressing Using the VT Close Curve and Dynamic Vdata Margin.

Citazione MLA

Kim, Yongduk., e Sekwang Park. Analysis of the Influence of the Address Electrode Width On High-speed Addressing Using the VT Close Curve and Dynamic Vdata Margin.

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