Volckens, J., & Leith, D. Response to comment on Electrostatic sampler for semivolatile aerosols: Chemical artifacts and Filter and electrostatic samplers for semivolatile aerosols : Physical artifacts.
Chicago Style citaatVolckens, John., en David Leith. Response to Comment On Electrostatic Sampler for Semivolatile Aerosols: Chemical Artifacts and Filter and Electrostatic Samplers for Semivolatile Aerosols : Physical Artifacts.
MLA citatieVolckens, John., en David Leith. Response to Comment On Electrostatic Sampler for Semivolatile Aerosols: Chemical Artifacts and Filter and Electrostatic Samplers for Semivolatile Aerosols : Physical Artifacts.
Let op: Deze citaties zijn niet altijd 100% accuraat.