Volckens, J., & Leith, D. Response to comment on Electrostatic sampler for semivolatile aerosols: Chemical artifacts and Filter and electrostatic samplers for semivolatile aerosols : Physical artifacts.
Chicago-stil citatVolckens, John., och David Leith. Response to Comment On Electrostatic Sampler for Semivolatile Aerosols: Chemical Artifacts and Filter and Electrostatic Samplers for Semivolatile Aerosols : Physical Artifacts.
MLA-referensVolckens, John., och David Leith. Response to Comment On Electrostatic Sampler for Semivolatile Aerosols: Chemical Artifacts and Filter and Electrostatic Samplers for Semivolatile Aerosols : Physical Artifacts.
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