Butler, J. M., Duewer, D. L., Kline, M. C., & Redman, J. W. NIST mixed stain study 3: DNA quantitation accuracy and its influence on short tandem repeat multiplex signal intensity.

Butler, John M., David L. Duewer, Margaret C. Kline, و Janette W. Redman. NIST Mixed Stain Study 3: DNA Quantitation Accuracy and Its Influence On Short Tandem Repeat Multiplex Signal Intensity.

Butler, John M., David L. Duewer, Margaret C. Kline, و Janette W. Redman. NIST Mixed Stain Study 3: DNA Quantitation Accuracy and Its Influence On Short Tandem Repeat Multiplex Signal Intensity.