Butler, J. M., Duewer, D. L., Kline, M. C., & Redman, J. W. NIST mixed stain study 3: DNA quantitation accuracy and its influence on short tandem repeat multiplex signal intensity.
Trích dẫn kiểu ChicagoButler, John M., David L. Duewer, Margaret C. Kline, và Janette W. Redman. NIST Mixed Stain Study 3: DNA Quantitation Accuracy and Its Influence On Short Tandem Repeat Multiplex Signal Intensity.
ציטוט MLAButler, John M., David L. Duewer, Margaret C. Kline, và Janette W. Redman. NIST Mixed Stain Study 3: DNA Quantitation Accuracy and Its Influence On Short Tandem Repeat Multiplex Signal Intensity.
אזהרה: ציטוטים אלה לעיתים לא מדויקים ב 100%.