Butler, J. M., Duewer, D. L., Kline, M. C., & Redman, J. W. NIST mixed stain study 3: DNA quantitation accuracy and its influence on short tandem repeat multiplex signal intensity.
Παραπομπή Chicago StyleButler, John M., David L. Duewer, Margaret C. Kline, και Janette W. Redman. NIST Mixed Stain Study 3: DNA Quantitation Accuracy and Its Influence On Short Tandem Repeat Multiplex Signal Intensity.
Παραπομπή MLAButler, John M., David L. Duewer, Margaret C. Kline, και Janette W. Redman. NIST Mixed Stain Study 3: DNA Quantitation Accuracy and Its Influence On Short Tandem Repeat Multiplex Signal Intensity.
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