Grazing exit electron probe microanalysis of submicrometer inclusions in metallic materials - Awane, Tohru; Ishikawa, Nobuhiro; Kimura, Takashi; Nakamura, Morihiko; Nishida, Kenji; Tanuma, Shigeo
Keywords: Dispersive spectrometry; Electron microprobe analysis; Inclusion; Particle; Stainless steel; Thin film; X ray spectrometry