Ro, C., Grieken, R. V., & Kim, H. An expert system for chemical speciation of individual particles using low-Z particle electron probe x-ray microanalysis data.
Chicago-tyylinen lähdeviittausRo, Chul-Un., Rene Van Grieken, ja HyeKyeong Kim. An Expert System for Chemical Speciation of Individual Particles Using Low-Z Particle Electron Probe X-ray Microanalysis Data.
MLA-viiteRo, Chul-Un., Rene Van Grieken, ja HyeKyeong Kim. An Expert System for Chemical Speciation of Individual Particles Using Low-Z Particle Electron Probe X-ray Microanalysis Data.
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