Simao, A., & Petrenko, A. Fault coverage-driven incremental test generation.
Chicago Style CitationSimao, Adenilso., i Alexandre Petrenko. Fault Coverage-driven Incremental Test Generation.
Cita MLASimao, Adenilso., i Alexandre Petrenko. Fault Coverage-driven Incremental Test Generation.
Atenció: Aquestes cites poden no estar 100% correctes.