01152nam a2200373 4500 DLU210196546 ##20210603 ##110308s2010 si a b 001 0 eng d 2011280775 9789814273329 9814273325 (OCoLC)ocn311763141 BTCTA BTCTA YDXCP SINTU TXA DEBSZ CDX DLC lccopycat 621.381 528 4 TA-C Tan, Cher Ming, 1959- Electromigration in ULSI Interconnections / Cher Ming Tan. Singapore ; Hackensack, NJ : World Scientific, c2010. xix, 291 p. : ill. ; 24 cm. Includes bibliographical references and index. Electrodiffusion. Integrated circuits Ultra large scale integration. International series on advances in solid state electronics and technology. 01/2021 SH 2383185 DLU True Nguyễn Thanh Hương G A SH Thư viện Trường Đại học Đà Lạt