Study on Material Properties of Si Thin Films Crystallized on Yttria-Stabilized Zirconia in Solid Phase by Pulsed Laser Annealing

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Study on Material Properties of Si Thin Films Crystallized on Yttria-Stabilized Zirconia in Solid Phase by Pulsed Laser Annealing

Chapter 1: Introduction; Chapter 2: Theory of Solid-Phase Crystallization (SPC) of an Amorphous Film; Chapter 3: Fabrication Procedures and Evaluation Methods; ...

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Opis bibliograficzny
1. autor:	Mai Thị Kieu Lien
Język:	eng
Dostęp online:	https://dlib.udn.vn/module/chi-tiet-sach?RecordID=1959
Etykiety:	Dodaj etykietę Nie ma etykietki, Dołącz pierwszą etykiete!

Thư viện lưu trữ:	Trung tâm Công nghệ thông tin và Học liệu số, Đại học Đà Nẵng

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