APA استشهاد

Khan, D. T. Multi-Scale Characterization of Crystalline Properties in Thick AlN Epitaxial Films Grown on Trench-Patterned Templates. Osaka University.

استشهاد بنمط شيكاغو

Khan, Dinh Thanh. Multi-Scale Characterization of Crystalline Properties in Thick AlN Epitaxial Films Grown On Trench-Patterned Templates. Osaka University.

MLA استشهاد

Khan, Dinh Thanh. Multi-Scale Characterization of Crystalline Properties in Thick AlN Epitaxial Films Grown On Trench-Patterned Templates. Osaka University.

تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.