Khan, D. T. Multi-Scale Characterization of Crystalline Properties in Thick AlN Epitaxial Films Grown on Trench-Patterned Templates. Osaka University.
Styl ChicagoKhan, Dinh Thanh. Multi-Scale Characterization of Crystalline Properties in Thick AlN Epitaxial Films Grown On Trench-Patterned Templates. Osaka University.
Citace podle MLAKhan, Dinh Thanh. Multi-Scale Characterization of Crystalline Properties in Thick AlN Epitaxial Films Grown On Trench-Patterned Templates. Osaka University.
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