Cita APA

Khan, D. T. Multi-Scale Characterization of Crystalline Properties in Thick AlN Epitaxial Films Grown on Trench-Patterned Templates. Osaka University.

Citación estilo Chicago

Khan, Dinh Thanh. Multi-Scale Characterization of Crystalline Properties in Thick AlN Epitaxial Films Grown On Trench-Patterned Templates. Osaka University.

Cita MLA

Khan, Dinh Thanh. Multi-Scale Characterization of Crystalline Properties in Thick AlN Epitaxial Films Grown On Trench-Patterned Templates. Osaka University.