Khan, D. T. Multi-Scale Characterization of Crystalline Properties in Thick AlN Epitaxial Films Grown on Trench-Patterned Templates. Osaka University.
Chicago Style aipamenaKhan, Dinh Thanh. Multi-Scale Characterization of Crystalline Properties in Thick AlN Epitaxial Films Grown On Trench-Patterned Templates. Osaka University.
MLA aipamenaKhan, Dinh Thanh. Multi-Scale Characterization of Crystalline Properties in Thick AlN Epitaxial Films Grown On Trench-Patterned Templates. Osaka University.
Kontuz: berrikusi erreferentzia hauek erabili aurretik.