APA-referens

Khan, D. T. Multi-Scale Characterization of Crystalline Properties in Thick AlN Epitaxial Films Grown on Trench-Patterned Templates. Osaka University.

Chicago-stil citat

Khan, Dinh Thanh. Multi-Scale Characterization of Crystalline Properties in Thick AlN Epitaxial Films Grown On Trench-Patterned Templates. Osaka University.

MLA-referens

Khan, Dinh Thanh. Multi-Scale Characterization of Crystalline Properties in Thick AlN Epitaxial Films Grown On Trench-Patterned Templates. Osaka University.

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