एपीए उद्धरण

Nguyễn, Đ. C., & Shih, C. (2023). Oxide thickness-dependent effects of source doping profile on the performance of single- and double-gate tunnel field-effect transistors.

शिकागो स्टाइल उद्धरण

Nguyễn, Đăng Chiến, और Chun-Hsing Shih. Oxide Thickness-dependent Effects of Source Doping Profile On the Performance of Single- and Double-gate Tunnel Field-effect Transistors. 2023.

एमएलए उद्धरण

Nguyễn, Đăng Chiến, और Chun-Hsing Shih. Oxide Thickness-dependent Effects of Source Doping Profile On the Performance of Single- and Double-gate Tunnel Field-effect Transistors. 2023.