APA Citatie

Sayil, S. (2020). Contactless VLSI Measurement and Testing Techniques. 1st ed. 2018. Springer International Publishing.

Chicago Style citaat

Sayil, Selahattin. Contactless VLSI Measurement and Testing Techniques. 1st Ed. 2018. Springer International Publishing, 2020.

MLA citatie

Sayil, Selahattin. Contactless VLSI Measurement and Testing Techniques. 1st Ed. 2018. Springer International Publishing, 2020.

Let op: Deze citaties zijn niet altijd 100% accuraat.