Sayil, S. (2020). Contactless VLSI Measurement and Testing Techniques. 1st ed. 2018. Springer International Publishing.
استشهاد بنمط شيكاغوSayil, Selahattin. Contactless VLSI Measurement and Testing Techniques. 1st Ed. 2018. Springer International Publishing, 2020.
MLA استشهادSayil, Selahattin. Contactless VLSI Measurement and Testing Techniques. 1st Ed. 2018. Springer International Publishing, 2020.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.