APA Citation

Sayil, S. (2020). Contactless VLSI Measurement and Testing Techniques. 1st ed. 2018. Springer International Publishing.

Chicago Style Citation

Sayil, Selahattin. Contactless VLSI Measurement and Testing Techniques. 1st Ed. 2018. Springer International Publishing, 2020.

MLA Citation

Sayil, Selahattin. Contactless VLSI Measurement and Testing Techniques. 1st Ed. 2018. Springer International Publishing, 2020.

Warning: These citations may not always be 100% accurate.