APA引文

Sayil, S. (2020). Contactless VLSI Measurement and Testing Techniques. 1st ed. 2018. Springer International Publishing.

Trích dẫn kiểu Chicago

Sayil, Selahattin. Contactless VLSI Measurement and Testing Techniques. 1st Ed. 2018. Springer International Publishing, 2020.

MLA引文

Sayil, Selahattin. Contactless VLSI Measurement and Testing Techniques. 1st Ed. 2018. Springer International Publishing, 2020.

警告：这些引文格式不一定是100％准确.