Brodusch, N., Demers, H., & Gauvin, R. (2020). Field Emission Scanning Electron Microscopy. 1st ed. 2018. Springer Singapore.
Chicago Style aipamenaBrodusch, Nicolas, Hendrix Demers, và Raynald Gauvin. Field Emission Scanning Electron Microscopy. 1st Ed. 2018. Springer Singapore, 2020.
MLA aipamenaBrodusch, Nicolas, Hendrix Demers, và Raynald Gauvin. Field Emission Scanning Electron Microscopy. 1st Ed. 2018. Springer Singapore, 2020.
Kontuz: berrikusi erreferentzia hauek erabili aurretik.