Brodusch, N., Demers, H., & Gauvin, R. (2020). Field Emission Scanning Electron Microscopy. 1st ed. 2018. Springer Singapore.
Trích dẫn kiểu ChicagoBrodusch, Nicolas, Hendrix Demers, và Raynald Gauvin. Field Emission Scanning Electron Microscopy. 1st Ed. 2018. Springer Singapore, 2020.
Deismireacht MLABrodusch, Nicolas, Hendrix Demers, và Raynald Gauvin. Field Emission Scanning Electron Microscopy. 1st Ed. 2018. Springer Singapore, 2020.
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