Brodusch, N., Demers, H., & Gauvin, R. (2020). Field Emission Scanning Electron Microscopy. 1st ed. 2018. Springer Singapore.
Chicago Style citaatBrodusch, Nicolas, Hendrix Demers, en Raynald Gauvin. Field Emission Scanning Electron Microscopy. 1st Ed. 2018. Springer Singapore, 2020.
MLA citatieBrodusch, Nicolas, Hendrix Demers, en Raynald Gauvin. Field Emission Scanning Electron Microscopy. 1st Ed. 2018. Springer Singapore, 2020.
Let op: Deze citaties zijn niet altijd 100% accuraat.