Handbook of X-ray spectrometry

Helps to improve fundamentals and applications of various modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. This title intends to promote the measurement of samples while reducing the scattered ba...

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Päätekijät: VanGriekan, ReneE, Markowicz, Andrzej
Aineistotyyppi: Kirja
Kieli:English
Julkaistu: Marcel Dekker 2013
Aiheet:
Linkit:https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/36071
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