Cita APA

Aliev, T. (2020). Digital Noise Monitoring of Defect Origin. Springer US.

Chicago Style Citation

Aliev, Telman. Digital Noise Monitoring of Defect Origin. Springer US, 2020.

Cita MLA

Aliev, Telman. Digital Noise Monitoring of Defect Origin. Springer US, 2020.

Atenció: Aquestes cites poden no estar 100% correctes.