APA Citation

Aliev, T. (2020). Digital Noise Monitoring of Defect Origin. Springer US.

Trích dẫn kiểu Chicago

Aliev, Telman. Digital Noise Monitoring of Defect Origin. Springer US, 2020.

MLA Citation

Aliev, Telman. Digital Noise Monitoring of Defect Origin. Springer US, 2020.

Advarsel: Disse citationer er muligvist ikke 100% nøjagtige.