APA Citation

Aliev, T. (2020). Digital Noise Monitoring of Defect Origin. Springer US.

Chicago Style Citation

Aliev, Telman. Digital Noise Monitoring of Defect Origin. Springer US, 2020.

MLA Citation

Aliev, Telman. Digital Noise Monitoring of Defect Origin. Springer US, 2020.

Warning: These citations may not always be 100% accurate.