APA aipamena

Aliev, T. (2020). Digital Noise Monitoring of Defect Origin. Springer US.

Chicago Style aipamena

Aliev, Telman. Digital Noise Monitoring of Defect Origin. Springer US, 2020.

MLA aipamena

Aliev, Telman. Digital Noise Monitoring of Defect Origin. Springer US, 2020.

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