Style de citation APA

Aliev, T. (2020). Digital Noise Monitoring of Defect Origin. Springer US.

Style de citation Chicago

Aliev, Telman. Digital Noise Monitoring of Defect Origin. Springer US, 2020.

Style de citation MLA

Aliev, Telman. Digital Noise Monitoring of Defect Origin. Springer US, 2020.

Attention : ces citations peuvent ne pas être correctes à 100%.