APA ציטוט

Aliev, T. (2020). Digital Noise Monitoring of Defect Origin. Springer US.

Trích dẫn kiểu Chicago

Aliev, Telman. Digital Noise Monitoring of Defect Origin. Springer US, 2020.

ציטוט MLA

Aliev, Telman. Digital Noise Monitoring of Defect Origin. Springer US, 2020.