APA način citiranja

Aliev, T. (2020). Digital Noise Monitoring of Defect Origin. Springer US.

Čikaški stil citiranja

Aliev, Telman. Digital Noise Monitoring of Defect Origin. Springer US, 2020.

MLA način citiranja

Aliev, Telman. Digital Noise Monitoring of Defect Origin. Springer US, 2020.

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