Aliev, T. (2020). Digital Noise Monitoring of Defect Origin. Springer US.
シカゴスタイル引用形Aliev, Telman. Digital Noise Monitoring of Defect Origin. Springer US, 2020.
MLA引用形式Aliev, Telman. Digital Noise Monitoring of Defect Origin. Springer US, 2020.
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