APA citiranje

Aliev, T. (2020). Digital Noise Monitoring of Defect Origin. Springer US.

Trích dẫn kiểu Chicago

Aliev, Telman. Digital Noise Monitoring of Defect Origin. Springer US, 2020.

MLA citiranje

Aliev, Telman. Digital Noise Monitoring of Defect Origin. Springer US, 2020.

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