Aliev, T. (2020). Digital Noise Monitoring of Defect Origin. Springer US.
Trích dẫn kiểu ChicagoAliev, Telman. Digital Noise Monitoring of Defect Origin. Springer US, 2020.
MLA引文Aliev, Telman. Digital Noise Monitoring of Defect Origin. Springer US, 2020.
警告：这些引文格式不一定是100％准确.