Bunke, H., Kandel, A., & Last, M. (2020). Applied Pattern Recognition. Springer Berlin Heidelberg.
Chicago Style CitationBunke, Horst, Abraham Kandel, i Mark Last. Applied Pattern Recognition. Springer Berlin Heidelberg, 2020.
Cita MLABunke, Horst, Abraham Kandel, i Mark Last. Applied Pattern Recognition. Springer Berlin Heidelberg, 2020.
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