Lienig, J., & Thiele, M. (2020). Fundamentals of Electromigration-Aware Integrated Circuit Design. Springer International Publishing.
استشهاد بنمط شيكاغوLienig, Jens, و Matthias Thiele. Fundamentals of Electromigration-Aware Integrated Circuit Design. Springer International Publishing, 2020.
MLA استشهادLienig, Jens, و Matthias Thiele. Fundamentals of Electromigration-Aware Integrated Circuit Design. Springer International Publishing, 2020.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.