Lienig, J., & Thiele, M. (2020). Fundamentals of Electromigration-Aware Integrated Circuit Design. Springer International Publishing.
Παραπομπή Chicago StyleLienig, Jens, και Matthias Thiele. Fundamentals of Electromigration-Aware Integrated Circuit Design. Springer International Publishing, 2020.
Παραπομπή MLALienig, Jens, και Matthias Thiele. Fundamentals of Electromigration-Aware Integrated Circuit Design. Springer International Publishing, 2020.
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