Cita APA

Lienig, J., & Thiele, M. (2020). Fundamentals of Electromigration-Aware Integrated Circuit Design. Springer International Publishing.

Citación estilo Chicago

Lienig, Jens, y Matthias Thiele. Fundamentals of Electromigration-Aware Integrated Circuit Design. Springer International Publishing, 2020.

Cita MLA

Lienig, Jens, y Matthias Thiele. Fundamentals of Electromigration-Aware Integrated Circuit Design. Springer International Publishing, 2020.