Lienig, J., & Thiele, M. (2020). Fundamentals of Electromigration-Aware Integrated Circuit Design. Springer International Publishing.
Style de citation ChicagoLienig, Jens, et Matthias Thiele. Fundamentals of Electromigration-Aware Integrated Circuit Design. Springer International Publishing, 2020.
Style de citation MLALienig, Jens, et Matthias Thiele. Fundamentals of Electromigration-Aware Integrated Circuit Design. Springer International Publishing, 2020.
Attention : ces citations peuvent ne pas être correctes à 100%.