APA ציטוט

Lienig, J., & Thiele, M. (2020). Fundamentals of Electromigration-Aware Integrated Circuit Design. Springer International Publishing.

Trích dẫn kiểu Chicago

Lienig, Jens, và Matthias Thiele. Fundamentals of Electromigration-Aware Integrated Circuit Design. Springer International Publishing, 2020.

ציטוט MLA

Lienig, Jens, và Matthias Thiele. Fundamentals of Electromigration-Aware Integrated Circuit Design. Springer International Publishing, 2020.