Hinrichs, K., & Eichhorn, K. (2020). Ellipsometry of Functional Organic Surfaces and Films. Springer International Publishing.
Chicago Style CitationHinrichs, Karsten, i Klaus-Jochen Eichhorn. Ellipsometry of Functional Organic Surfaces and Films. Springer International Publishing, 2020.
Cita MLAHinrichs, Karsten, i Klaus-Jochen Eichhorn. Ellipsometry of Functional Organic Surfaces and Films. Springer International Publishing, 2020.
Atenció: Aquestes cites poden no estar 100% correctes.