Cita APA

Ventura, S., & Luna, J. M. (2020). Supervised Descriptive Pattern Mining. Springer International Publishing.

Chicago Style Citation

Ventura, Sebastián, i José María Luna. Supervised Descriptive Pattern Mining. Springer International Publishing, 2020.

Cita MLA

Ventura, Sebastián, i José María Luna. Supervised Descriptive Pattern Mining. Springer International Publishing, 2020.

Atenció: Aquestes cites poden no estar 100% correctes.