Ventura, S., & Luna, J. M. (2020). Supervised Descriptive Pattern Mining. Springer International Publishing.
Trích dẫn kiểu ChicagoVentura, Sebastián, và José María Luna. Supervised Descriptive Pattern Mining. Springer International Publishing, 2020.
ציטוט MLAVentura, Sebastián, và José María Luna. Supervised Descriptive Pattern Mining. Springer International Publishing, 2020.
אזהרה: ציטוטים אלה לעיתים לא מדויקים ב 100%.